29. Ellipsometry is commonly used to measure the thickness of films. Which of the following signal is
detected in ellipsometry?
(A) resonance angle
(B) reflected laser spot
(C) second-harmonic generation
(D) polarized light
(E) none of the above
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統計: A(2), B(2), C(1), D(5), E(0) #3222796
統計: A(2), B(2), C(1), D(5), E(0) #3222796
詳解 (共 1 筆)
#6341128
橢圓偏振技術(Ellipsometry)是一種用於測量薄膜厚度的光學技術,通過測量光在反射時的偏振狀態變化來了解薄膜的光學和物理特性。
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