1. A doped semiconductor in thermal equilibrium in which the electrostatic potential (with respect to intrinsic silicon) has been measured and found to be as indicated in Fig. 1.
Assume that μn = 1000 cm²/V-s and μp = 550 cm²/V-s at 300 K.
(a) Calculate the electron and hole concentrations at x = 0, 5, and 10 μm.